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TC Temperature Cycle Test Chamber
Semiconductor

TC Temperature Cycle Test Chamber

Used to evaluate the reliability and durability of products under extreme temperature changes. By repeatedly cycling between high and low temperatures, it simulates the temperature stress in the actual environment and accelerates the material aging process. It is suitable for environmental adaptability testing in the electronics, electrical appliances, automobiles, aerospace and other industries.

    Technical Parameters

    Model

    CZ-C-80

    (D~G)

    CZ-C-100

    (D~G)

    CZ-C-150

    (D~G)

    CZ-C-225

    (D~G)

    CZ-C-408

    (D~G)

    CZ-C-608

    (D~G)

    CZ-C-1000

    (D~G)

    Internal size (W×H×D) (mm)

    400x500x400

    400x500x500

    500x600x500

    600x750x600

    600x850x800

    800x950x800

    1000x1000x1000

    External size (W×H×D) (mm)

    900x1360x940

    600x1650x1100

    700x1750x1100

    1000x1610x1170

    1100x1710x1370

    1300x1810x1370

    1500x1860x1570

    Temperature range

    -70℃~+100℃(150℃)(D:-40℃ G:-70℃)

    Humidity range

    20%~98%R.H.(10%-98%R.H/5%~98%R.H is a special selection condition)

    Temperature and humidity analysis accuracy/uniformity

    0.01℃;0.1%R.H./±1.0℃;±3.0%R.H.

    Temperature and humidity control accuracy/fluctuation

    ±1.0℃;±2.0%R.H./±0.5℃;±2.0%R.H.

    Heating/Cooling rate

    Average 2~15℃/min (only for 408L and above machines with 5~15℃/min cooling rate)

    Structural Characteristics  

    ● High-quality appearance, the machine body adopts arc shape, the surface is treated with baking varnish, and it adopts flat non-reaction handle, which is easy to operate, safe and reliable.
    ● Rectangular double-layer glass viewing window can be used to observe the test product during the test. The window has an anti-sweat electric heater device to prevent water vapor from condensing into water droplets, and a high-brightness PL fluorescent lamp maintains the lighting inside the box.
    ● The double-layer insulation sealing strip of the box door can effectively isolate the internal temperature leakage.
    ● It has an external water supply system, which is convenient for replenishing the water supply of the humidification barrel and automatically recycling it for use.
    ● The refrigeration and dehumidification system adopts the French "Taikang" brand compressor, which has the advantages of energy saving, low noise, low energy consumption, stable performance, etc., and uses environmentally friendly refrigerant (R23, R404a).
    ● The controller adopts an imported LCD display screen, which can simultaneously display the measured value, set value, time, etc.
    The controller has multi-segment program editing and temperature and humidity can be quickly (QUICK) or slope (SLOPE) controlled.
    ● The bottom of the machine is equipped with a moving pulley and a positioning foot cup for easy movement, placement and fixed position.
    * The laboratory can be customized according to customer needs to meet the various testing needs of the Semiconductor Industry!

    Structural Characteristics  

    This test chamber is suitable for (complete machines), parts, materials, electrical, electronic, instrumentation products and other types of products. It is a method for screening the climate, thermal or mechanical stress that may cause premature failure of the sample. For example, it can find defects in electronic module design, materials or production. It can be used to determine the adaptability of electronic products, automotive parts, materials, etc. under conditions such as rapid high and low temperature alternating cycles, high temperature storage, and low temperature storage.

    Temperature Control Range

    Temperature control range

    Meet the Temperature Change Rate

    5℃/min, 10℃/min, 15℃/min, 25℃/min, 30℃/min, linear and nonlinear can be customized as required

    Meets the Test Standards

    ● GB2423.1-2008/IEC6008-2-1-2007 Part 2: Test methods Test A: Low temperature
    ● GB/T 2423.2-2008 Part 2: Test methods Test B: High temperature
    ● GJB150.3A-2009 High temperature test method
    ● GJB150.4A-2009 Low temperature test method
    ● GB2423.22-2008 Environmental testing for electric and electronic products Part 2 Test Nb: Temperature change at a specified temperature change rate
    ● GBT 2424.5-2006 Environmental testing for electric and electronic products Confirmation of performance of temperature test chambers
    ● GB/T 10589-2008 Technical conditions for low temperature test chambers
    ● GBT 2424.7-2006 Environmental testing for electric and electronic products Measurement of temperature test chambers for tests A and B (with load)

    Selection Reference

    Rapid temperature change test chamber selection reference

    Contact Us

    Zhongzhi Testing as a professional test chamber manufacturer, We provide customized services to meet your specific needs, including our TH High and Low Temperature Humidity Test Chamber. For more information, please feel free to contact us.

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